Ref: JDI-100 / JDI-200

Temperatre compensated digital MEMS inclinometer - 1 or 2 axis - IP67

  • ±1°, ±3°, ±14.5°, ±30° and ±60° ranges
  • Robust and Rugged Enclosure
  • Single and Dual Axis Models Available
  • Low-Cost MEMS Technology
  • RoHS Compliant
  • Filtering Available
  • Single DC Power Input, Galvanically Isolated
  • RS-485 Half Duplex, Galvanically Isolated
  • Integrated Temperature Sensor
  • P67 Seal (when mated to IP67 connector)

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JDI-100/200 inclinometer series is a MEMS, ruggedized inclinometer with digital output (RS-485) and full temperature compensation across all measuring ranges which enables the unit to perform to 0.005° accuracy.

JDI-100/200 series utilizes MEMS technology to measure tilt in either single (JDI-100) or dual-axis (JDI-200). ±1°, ±3°, ±14.5°, ±30° and ±60° are the standard measuring ranges with a 0.0001° digital resolution and RS485 interface output. It is also RoHS compliant to satisfy environmental standards.

With a lightweight aluminum enclosure and an IP67 seal, the JDI can serve a diverse number of OEM and industrial applications. It can be used for:

  • industrial automation and control
  • construction and agricultural equipment
  • solar tracking
  • mobile cranes
  • platform leveling and positioning
  • mobile radar equipment
  • bridge monitoring and more.
Technologie
MEMS capacitive
Number of Axis
1 Axis, 2 Axis
Etendue de mesure
1 / 3 / 14.5 / 30 / 60 °
Résolution
0.001° - 0.01°
Application
High Accuracy, OEM
Nonlinearity (% FS)
± 0.01 %
Nonrepeatability
0.01 % FS
Sortie analogique
RS-232/422/485
Digital output signal
RS-485
Tension d'alimentation
10 Vcc
Température de fonctionnement
-55 to 85 °C
Protection Class
IP67
Housing
Steel

Available Models

  • JDI-100-1: ±1.0°

  • JDI-100-3: ±3.0°

  • JDI-100-14.5: ±14.5°

  • JDI-100-30: ±30.0°

  • JDI-100-60: ±60.0°

  • JDI-200-1: ±1.0°

  • JDI-200-3: ±3.0°

  • JDI-200-14.5: ±14.5°

  • JDI-200-30: ±30.0°

  • JDI-200-60: ±60.0

options

  • Temperature output
  • afficheurs
  • Systèmes d'acquisition de données

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